International Conference on Silicon Carbide and Related Materials ICSCRM 2022
Selected peer-reviewed extended articles based on abstracts presented at the 19th International Conference on Silicon Carbide and Related Materials (ICSCRM) 2022Aggregated Book
| ISBN: | 9783036401676 |
|---|---|
| Sprache: | Englisch |
| Seitenzahl: | 836 |
| Produktart: | Kartoniert / Broschiert |
| Herausgeber: | Grossner, Ulrike Marek, Juraj Pobegen, Gregor |
| Verlag: | Trans Tech |
| Veröffentlicht: | 15.06.2023 |
| Schlagworte: | Basal Plane Dislocation Chemical Vapor Deposition Crystal Defect Inspection Diode Dislocation Doping Electrical Properties Epitaxial Growth Etching |
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