Sampling, Wavelets, and Tomography
Sampling, wavelets, and tomography are three active areas of contemporary mathematics sharing common roots that lie at the heart of harmonic and Fourier analysis. The advent of new techniques in mathematical analysis has strengthened their interdependence and led to some new and interesting results in the field. Aimed at mathematicians, scientists, and engineers working in signal and image processing and medical imaging, the work is designed to be accessible to an audience with diverse mathematical backgrounds. Although the volume reflects the contributions of renowned mathematicians and engineers, each chapter has an expository introduction written for the non-specialist. One of the key features of the book is an introductory chapter stressing the interdependence of the three main areas covered. A comprehensive index completes the work.
| ISBN: | 9780817643041 |
|---|---|
| Sprache: | Englisch |
| Seitenzahl: | 344 |
| Produktart: | Gebunden |
| Herausgeber: | Benedetto, John J. Zayed, Ahmed I. |
| Verlag: | Birkhäuser Boston |
| Veröffentlicht: | 10.12.2003 |
| Schlagworte: | Algebra Fourier analysis Interpolation Jitter Signal Wavelet algorithm algorithms calculus computed tomography (CT) |
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