VLSI Design and Test for Systems Dependability
Is the first book to focus on the new roles VLSI is taking for the safe, secure, and dependable design and operation of electronic systemsContributes to a better understanding of threats against safe and secure systems and how to mitigate them by advanced design and testing of VLSI as core componentsDescribes specific applications of design and testing for dependability in real-world applications such as controls for robots and vehicles, wireless communications, system of systems, and the Internet of Things (IoT)
ISBN: | 9784431565925 |
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Sprache: | Englisch |
Seitenzahl: | 800 |
Produktart: | Gebunden |
Herausgeber: | Asai, Shojiro |
Verlag: | Springer Tokyo |
Veröffentlicht: | 01.08.2018 |
Schlagworte: | CREST Program Error Correction Fault Tolerant Safety and Security Semiconductor Circuits Systems Dependability VLSI Design and Test Very Large Scale Integration quality control, reliability, safety and risk |
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